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Manuscript Title: SBGBBG, a program to evaluate the macroscopic strain/stress tensor of a polycrystalline sample from X-ray reflection positions.
Authors: T. Wieder
Program title: SBGBBG
Catalogue identifier: ADAF_v1_0
Distribution format: gz
Journal reference: Comput. Phys. Commun. 85(1995)398
Programming language: Fortran.
Computer: IBM RS6000.
Operating system: UNIX, AIX, VMS.
Keywords: Crystallography, X-ray diffraction, Strain tensor, Stress tensor, Texture.
Classification: 8.

Nature of problem:
Residual stresses in a polycrystalline sample cause changes in lattice plane distances which result in a shift of the X-ray reflections. The reflection shift depends on the measurement direction within the sample and therefore we can utilize the shift to evaluate the residual stress, i.e. the stress tensor.

Solution method:
From the reflection shift we obtain the lattice strain along the measurement direction. From the set of strain values along different measurement directions (i.e. from strain values given in L), we calculate the strain/stress tensor (expressed in S) by the general transformation equation. To convert strains to stresses we use poly- crystal elastic compliances, which we calculate from the orientation distribution function (ODF) of the polycrystalline sample.