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Manuscript Title: REX: a least-squares fitting program for the simulation and analysis of X-ray reflectivity data.
Authors: T.A. Crabb, P.N. Gibson, K.J. Roberts
Program title: REX
Catalogue identifier: ACPI_v1_0
Distribution format: gz
Journal reference: Comput. Phys. Commun. 77(1993)441
Programming language: Fortran.
Computer: SUN 4.0.
Operating system: UNIX.
Keywords: Crystallography, X-ray reflectivity, Roughness, Thickness, Thin films, Anomalous dispersion, Multiple pattern fitting.
Classification: 8.

Nature of problem:
Interpretation of X-ray reflectivity spectra from thin films or multilayers.

Solution method:
Interactive least-squared-fitting of experimental data to theoretical model [2] including roughness [3] [4] and anomalous dispersion effects [1]. Multiple pattern fitting of spectra taken at different wavelengths is allowed.

[1] D.T. Cromer, J.Appl. Cryst. 16(1983)437
[2] L.G. Parratt, Phys.Rev. 95(1954)1593
[3] R.A. Cowley and T.W. Ryan, J.Phys. D20(1987)61
[4] L. Nevot and P. Croce, Rev.Phys.Appl. 15(1980)761