Programs in Physics & Physical Chemistry
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Programs in Physics & Physical Chemistry |
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| Manuscript Title: REX: a least-squares fitting program for the simulation and analysis of X-ray reflectivity data. | ||
| Authors: T.A. Crabb, P.N. Gibson, K.J. Roberts | ||
| Program title: REX | ||
| Catalogue identifier: ACPI_v1_0 Distribution format: gz | ||
| Journal reference: Comput. Phys. Commun. 77(1993)441 | ||
| Programming language: Fortran. | ||
| Computer: SUN 4.0. | ||
| Operating system: UNIX. | ||
| Keywords: Crystallography, X-ray reflectivity, Roughness, Thickness, Thin films, Anomalous dispersion, Multiple pattern fitting. | ||
| Classification: 8. | ||
Nature of problem: Interpretation of X-ray reflectivity spectra from thin films or multilayers. | ||
Solution method: Interactive least-squared-fitting of experimental data to theoretical model [2] including roughness [3] [4] and anomalous dispersion effects [1]. Multiple pattern fitting of spectra taken at different wavelengths is allowed. | ||
References: | ||
| [1] | D.T. Cromer, J.Appl. Cryst. 16(1983)437 | |
| [2] | L.G. Parratt, Phys.Rev. 95(1954)1593 | |
| [3] | R.A. Cowley and T.W. Ryan, J.Phys. D20(1987)61 | |
| [4] | L. Nevot and P. Croce, Rev.Phys.Appl. 15(1980)761 | |
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